SPECS ARPES System for Synchrotron Application

The SPECS ARPES system for synchrotrons is a fully equipped ARPES and XPS system for modern surface analysis. It features the latest PHOIBOS analyzer series in combination with a ultra low temperature manipulator, sophisticated sample handling and an additional small spot UV and monochromated X-ray source. The analysis module is based on a special µ-metal chamber optimized for low kinetic energy analysis. A dedicated surface science preparation module with all necessary techniques (surface cleaning, LEED, deposition, sample storage) is included as well as a fast entry loadlock.

KEY FEATURES

• PHOIBOS ARPES Analyzer
• Energy Resolution <1.8 meV
• Angular Resolution <0.1°
• Dedicated Beamnline Entrance
• Small Spot UV and X-Ray Source with High Intensity
• Low Temperature 5 Axes Manipulator
• Sample Strorage and Transfer Chamber
• Pressure in Analysis Chamber <2 x 10^-10 mbar
• Sample Preparation Module