PHELOS

Gonio-Spectrometer for Angle-Dependent EL and PL Measurements

Advantages - Operation Modes - Specifications - Video Presentation - Download Brochure - References

Overview

Phelos is an angular luminescence spectrometer to characterize light-emitting devices and thin films over varied emission and polarization angles. While traditional goniometric instruments focus on either electroluminescence (EL) or photoluminescence (PL), Phelos incorporates both measuring techniques in one table-top compact instrument. The Phelos software can be easily coupled to the powerful simulation software Setfos for data analysis, parameter extraction, and device modeling.

Trusted by industry and academia, Phelos measurements have substantially contributed to numerous scientific publications

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Phelos angle-dependent photoluminescence (PL)/electroluminescence (EL) spectrometer along with Setfos package is a great combination of hardware and software to characterize the orientation of emission transition dipole moment. User-friendly interface and a broad range of parameters, such as polarization angles, position angles, driving current, and J-V parameters to investigate the PL as well as EL characteristics of light-emitting semiconductors. We have extensively used both Phelos and Setfos to understand the quantum emission characteristics of perovskites and organometallic complexes and light-extraction efficiency in PeLEDs and OLEDs. We found these tools allowed fast data acquisition, simulation, and in-depth understanding of emission characteristics of LEDs and OLEDs

Dr. Sudhir Kumar, Nanomaterials Engineering Research Group, Institute for Chemical and Bioengineering, ETH Zürich

Advantages

  • Angular photoluminescence (PL) spectroscopy on organic, quantum-dot, and perovskite light-emitting thin films.

  • Angular electroluminescence (EL) spectroscopy on OLEDs and other light-emitting devices.

  • Angle dependence of the light emission of an OLED and other light-emitting devices.

  • Compatible with top and bottom emitting OLED structures.

  • Detection of p- and s-polarized signal, or continuous sweep over polarization angles.

  • Determine where in your emission layer the dipoles are emitting, and which is the orientation of the dipoles.

  • Integrated data analysis allows you to determine dipole orientation with one click.

  • Easily coupled to Setfos for advanced parameter extraction and device modeling.

  • Flexible contacting of any sample geometry and easy sample alignment.

  • Acquire current-voltage-luminance (IVL) curves with the integrated SMU

  • Measure: EQE, lm/W, Cd/A, CRI, and CIE coordinates

  • Polarizers and macro-extraction lens included. Multiple light sources are available.

     

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You can download our detailed presentation of Phelos


Different Operation Modes

Phelos is a spectrometer for both Photoluminescence and Electroluminescence measurements. The instrument is equipped with an internal SMU that is used alternatively for the EL or PL characterization.

Electroluminescence

Down-Conversion and Scattering

Photoluminescence

measurement system for the analysis of the electroluminescence of an organic light-emitting diode and a perovskite light-emitting diode

MEASUREMENT SYSTEM FOR THE ANALYSIS OF THE ELECTROLUMINESCENCE OF AN ORGANIC LIGHT-EMITTING DIODE AND A PEROVSKITE LIGHT-EMITTING DIODE

photoluminescence thin film characterization instrument

PHOTOLUMINESCENCE THIN FILM CHARACTERIZATION INSTRUMENT

characterization of down conversion in quantum dots

CHARACTERIZATION OF DOWN CONVERSION IN QUANTUM DOTS

  • Analysis of the Color Efficiency.

  • Viewing Angle.

  • (EQE, lm/W, Cd/A) .

  • Fitting of the Emission Zone.

  • Emitter Orientation.

  • Angular Dependent Analysis of the light emission characteristics.

  • Emitter orientation.

  • Spectrum and Color per Emission Angle.

  • Polarization in Light-Emitting Thin Films.

  • Characterization of the Scattering and Down-Conversion in Thin Films

  • OLEDs functionalized with Quantum Dots

Post-processing of Experimental Data:

  • Working point

  • Efficacy (cd/A)

  • CIE coordinates

  • Color temperature, CRI …

  • Spectral Irradiance/Intensity

  • Radiance/Radiant Intensity

  • Luminous Intensity

analysis of the CIE coordinates of a display
OLED efficiency post-processing

The software provided with Phelos is an all-in-one platform to characterize your sample and analyze your data. The Graphical User Interface (GUI) allows you to extract easily the orientation of the dipoles in your light-emitting film with an automated fitting routine.

the graphical user interface of the software controlling phelos. The automated fitting procedure helps to extract the orientation of the dipole in the light-emitting layer

Want to know more about How to use Phelos for Quantum-Dots?


Specifications

Photoluminescence and Electroluminescence
Angular Range -90° to +90°, top and bottom emission
Optical Resolution < 0.5°
Spectral Range 360 to 1100 nm *
Spectral Resolution 2.5 nm *
Signal-to-noise ratio 300:1
Voltage Range ± 20 V
Current Range ± 120 mA
Minimal Resolvable Current < 100 pA
Motorized Polarizer 0 to 360° (continuous)
Sample stage size 40 x 40 mm2
PL Excitation 275 nm to 405 nm **
Computer Connection USB
Weight 18 kg
Dimensions 50 x 29 x 24 cm3
PL Illumination Spot Size 5 x 3 mm2
* Smaller spectral range with higher resolution available upon request.
** Default wavelength is 365 nm. Various excitation wavelengths optionally available
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Check the Publications that show the potential of Phelos