A Momentum Microscope is a highly resolving energy filter with a PEEM lens in front. In PEEM mode this lens allows for energy filtered images of the sample surface in real space. The lateral resolution is typically 50-100 nm. A field aperture allows for selection of the acceptance area in µm size.
The term momentum microscopy (MM) describes a modern approach to investigate the electronics structure of solids. MM experiments utilize a combined PEEM/ARPES spectrometer to couple lateral information of small sample sizes with the spectroscopic analysis of such, thus being a giant leap in the analysis of novel materials.