FE-LEEM/PEEM P90

The FE-LEEM/PEEM P90 is a combined LEEM and PEEM Instrument for High Resolution Microscopy

KEY FEATURES

• 5 nm resolution
• 90° magnetic deflector
• Cold Field emitter
• Energy filter (optional)
• Rapid LEED/LEEM switching
• Fast sample exchange
• Energy filtered PEEM with focussing UV source UVS 300

The SPECS FE-LEEM/PEEM P90 system is a fully equipped UHV analysis system for modern surface microscopy. All systems are designed and manufactured at the SPECS headquarter in Berlin. A special engineering group personally accompanies the system process from the order placing until the final acceptance. Our engineers are dedicated to highest quality and usability of the system during design, testing and setup on site. Once the system is in full operation a professional service team in our HQ and our worldwide branch offices takes care of a smooth and stable operation.

The SPECS LEEM instrument FE-LEEM P90 is a next generation Low Energy Electron Microscope with unsurpassed 5 nm resolution for dynamic LEEM microscopy experiments. With this instrument, based on the design of Dr. Rudolf Tromp, nanometer scale processes on surfaces can be observed in real-time. 

Guiding the design of the SPECS FE-LEEM P90 was the goal to achieve an extremely high resolution with a minimum number of electronoptical elements. 
In order to achieve this incoming and outgoing electrons are separated by a 90° magnetic prism array. This geometry allows a simple, intuitive step by step adjustment of all lens parameters. The magnetic prism transfers both the LEEM image and the LEED pattern astigmatically, allowing routine switching between real image and diffraction. Both image and LEED pattern are transferred without the negative effects of chromatic dispersion, offering superior image and diffraction capabilities. 
A sophisticated energy filter enables imaging with an energy resolution down to 250 meV with a minimal impact on the high spatial resolution of the instrument. 
The FE-LEEM P90 is integrated into a UHV LEEM sample analysis chamber with facilities for sample preparation and in-situ high temperature sample processing.

Ultimate resolution with the LEEM For the University of Erlangen-Nürnberg

This application note shows ultimate resolution LEEM data taken with the SPECS FE-LEEM P90 that has been produced for the group of Prof. Seyller, Universität Erlangen-Nürnberg. The data has been taken at SPECS in July 2011. The data shows an ultimate resolution of 4.2 nm (16% - 84%).

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