Proven Analysis System for State-of-the-Art Momentum Microscopy
The ProvenX system series represents the quintessence of our extensive knowledge in developing and manufacturing complete surface analysis systems that fulfill the most demanding scientific requirements. This system concept combines the most required analysis techniques with the latest and proven technology for ultimate performance.
The ProvenX-MM system is a specialized systembase for momentum microscopy solutions, supporting the KREIOS 150 Series, parallel single event detectors and optional spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS HESTIA low temperature microscopy stage. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.
System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.
The system can be equipped with an optional small spot x-ray source for material characterization. Additional software and preparation tools are available.
KEY FEATURES
- High Resolution Momentum Microscope
- Low Temperature Sample Stage
- Monochromated Small Spot UV Source
- Reliable and Proven System Design
- Optional Small Spot Monochromated XPS Imaging Function
- Fully Automated System Control
- Including Preparation Chamber, Loadlock and Sample Storage
SPECIFICATIONS
PROVENX-MM
Performance
| Energy Resolution |
< 10 meV (< 5 meV achievable) with KREIOS 150 |
| k-Resolution |
< 0.008 Å-1 with KREIOS Series |
| Acceptance Angle |
< 3.6 Å-1 / ±90° with KREIOS Series |
| Sample Temperature |
< 9 K with HESTIA Sample Stage |
| Spot Size |
< 100 µm UV Spot Size with UVS µFOCAL |
| Residual Magentic Field |
< 0.5 µT in Analysis Chamber |
| Base Pressure |
< 2x10-10 mbar in Analysis and Preparation Chamber |
Configuration
| Electron Energy Analyser |
SPECS KREIOS 150 Electron Momentum Spectrometer |
| Detector |
2D-CMOS True Parallel Pulse Counting Detector optional: |
| Analysis Chamber |
spherical µ-metal chamber |
| Manipulator |
HESTIA Sample Stage |
| Preparation Chamber |
Stainless Steel Preparation Chamber |
| Load Lock |
Fast Entry Load Lock with Sample Storage for 4 Samples |
| UV Source |
SPECS UVS with µFOCAL capillary and optional TMM 304 UV Monochromator |
| X-Ray Source |
SPECS µFOCUS 500 X-Ray Monochromator with Al kα Anode |
| Sample Storage |
4 Slots in Analysis Chamber and 4 Slots in Loadlock Chamber |
| Vacuum Control |
SPECS Vacuum Control Software for Full Vacuum System Automation |
| Operating Software |
SpecsLab Prodigy Control Software |
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