Proven Analysis System for State-of-the-Art ARPES

The ProvenX system series represents the quintessence of our extensive knowledge in developing and manufacturing complete surface analysis systems that fulfill the most demanding scientific requirements. This system concept combines the most required analysis techniques with the latest and proven technology for ultimate performance.

The ProvenX-ARPES system is a dedicated small spot ARPES analysis tool, supporting the new ASTRAIOS 190 electron analyzer with single spot shifting lens, parallel single event detectors and optional 3D spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS Ganymed low temperature manipulator series. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.

System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.

The system can be equipped with an optional small spot x-ray source for material characterization, electron sources and charge neutralization sources. Additional software and preparation tools are available.

KEY FEATURES

• High Resolution Electron Momentum Mapping Analyzer
• Low Temperature Sample Handling
• Monochromated Small Spot UV Source
• Reliable and Proven System Design
• Optional Small Spot Monochromated XPS Function
• Fully Automated System Control
• Including Preparation Chamber, Loadlock and Sample Storage