AFM - SOLVER NANO

Brand: NT-MDT

Product Code: SOLVER-NANO

Availability: On Request

Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.
  • Compact desktop AFM/STM for both education and science
  • Full set of AFM/STM modes
  • High AFM/STM performance
  • Closed-loop Scanner

  • Applications

    Solver Nano is designed by the NT-MDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications.

    Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

    These capabilities enable all of the basic AFM techniques in compact SPM design.

    Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below:

    • Polymers
    • Bio objects
    • Carbon Materials

    Configuration and experimental setup:

    • Solver Nano with AFM head.
    • CL 100 um piezotube scanner. CL enabled.
    • Digital controller.
    • Active vibration isolation.
    • Results from intermittent contact mode (topography, phase, and amplitude image).

    The functionality of SOLVER Nano significantly increases due to the use of various options:

    - Nano Vacuum Australia and New Zealand

    Available SPM modes

    HybriDTMAFM technique

    Contact AFM
    Constant Height mode
    Constant Force mode
    Contact Error mode
    Lateral Force Imaging
    Spreading Resistance Imaging
    Force Modulation Microscopy
    Piezoresponse Force Microscopy

    Amplitude modulation AFM,
    Attractive & Repulsive regimes

    Relief Imaging
    Phase Imaging mode
    Error mode

    Electrostatic Force Mikroscopy
    Scanning Capacitance Force Microscopy
    Kelvin Probe Force Microscopy

    Magnetic Force Microscopy

    AFM Spectroscopies
    Force-distance curves
    Adhesion Force imaging
    Amplitude-distance curves
    Phase-distance curves
    Frequency-distance curves
    Full-resonance Spectroscopy

    STM techniques
    Constant Current mode
    Constant Height mode
    Barrier Height imaging
    Density of States imaging
    I(z) Spectroscopy
    I(V) Spectroscopy

    Lithographies
    АAFM Oxidation Lithography
    STM Lithography
    AFM Lithography - Scratching
    AFM Lithography - Dynamic Plowing

     

    Specifications

    General specs:

    Scanner 100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
    AFM resolution 0.01 nm
    Environments Air and liquid measurements.
    Combined video optical microscopes
    Build in 100x optical USB microscope
    External 500x optical microscope
    Design Table-top, affordable, robust and user-friendly
    Scanner
    Scanning field High voltage regime: 100x100x12 um
    Low voltage regime: 3x3x3 um
    Scanner type Metrological piezotube XYZ scanner with sensors
    Sensors type XYZ – ultrafast capacitance sensors
    Sensors noise Low noise XY sensor: <0.3 nm
    Metrological Z sensor: <0.03 nm
    Sensors linearity     Metrological XY sensor: <0.1%
    Metrological Z sensor: <0.1%
    Overall scanner parameters 100x100x12 um with CL
    Resolution: XY - 0.3 nm, Z - 0.03 nm
    Linearity: XY - <0.1%, Z - <0.1%
    3x3x3 um with OL. Resolution: XY - 0.05 nm,
    Z - 0.01 nm
    Sample
    Sample positioning range 12 mm
    Sample positioning resolution 1.5 um
    Sample dimension up to 1,5” X 1,5” X 1/2”, 35x35x12 mm
    Sample weight up to 100 g
    Approach system type Z – Stepper Motor
    Approach system step size 230 nm
    Approach system speed rate 10 mm per min
    Algorithm Gentle approach Available (probe guaranteed to stop before it touches the sample)
    Scanning Heads
    AFM head for Si cantilever Available. All commercial cantilevers can be used
    Type of cantilever detection Laser/Detector Alignment
    Probe holders Probe holder for air measurements. Probe holder for liquid measurements.
    Type of AFM head mounting Cinematically mount. Mount accuracy 150 nm
    (Remove/mount accuracy)
    STM AFM head for wire probes Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements
    Type of cantilever detection Piezo for AFM measurement
    Probe holders Probe holder for air and liquid measurements
    Controllers. Digital professional controller
    Number of images can be acquired during one scanning cycle Up to 16
    Image size Up to 8Kx8K scan size
    ADC 500 kHz 16-bit ADC
    12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
    Individual filter on each channel
    DSP Floating point 320 MHz DSP
    Digital FB Yes 6 Channels
    DACs: 4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
    2 16-bit DAC for user output
    XYZ scanner control voltage High-voltage outputs: X, -X, Y, -Y, Z, -Z
    at -150 V to +150 V
    Low-voltage mode XY ± 10 V
    XY RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
    Z RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
    XY bandwidth 4 kHz (LV regime – 10 kHz)
    Z bandwidth 9 kHz
    Maximal current of XY amplifiers 1.5 mA
    Maximal current of Z amplifiers 8 mA
    Integrated demodulator for X,Y,Z capacitive capacitance sensors    Yes
    Open/Closed-loop mode for X,Y controlх Yes
    Generator frequency setting range DC – 5 MHz
    Deflection registration channel bandwidth 170 Hz - 5 MHz
    Lateral Force registration channel bandwidth 170 Hz - 5 MHz
    2 additional registration channel bandwidth 170 Hz - 5 MHz
    Bias Voltage ± 10 V bandwidth 0 – 5 MHz
    Modulating signals supply To the probe (external output);
    High-voltage X,Y, Z channels
    (including LV regime);
    Bias Voltage
    Number of generators for modulation, user accessible 2,  0-5 MHz, 0.1 Hz resolution
    Stepper motor control outputs Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
    Additional digital inputs/ outputs 6
    Additional digital outputs 1
    I2C bus Yes
      Macro language
    Max. cable length between the controller and SPM base or measuring heads 2 m
    Computer interface USB 2.0
    Voltage supply 110/220 V
    Power consumption ≤ 110 W