Name: AFM - SOLVER NANO
Brand: NT-MDT
SKU: SOLVER-NANO
Availability: InStock

AFM - SOLVER NANO

Brand: NT-MDT

Product Code: SOLVER-NANO

$POR

Ask about this product

Add to Compare

Description Reviews

Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.

Compact desktop AFM/STM for both education and science

Full set of AFM/STM modes

High AFM/STM performance

Closed-loop Scanner

Applications

Solver Nano is designed by the NT-MDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications.

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

These capabilities enable all of the basic AFM techniques in compact SPM design.

Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below:

Polymers
Bio objects
Carbon Materials

Configuration and experimental setup:

Solver Nano with AFM head.
CL 100 um piezotube scanner. CL enabled.
Digital controller.
Active vibration isolation.
Results from intermittent contact mode (topography, phase, and amplitude image).

The functionality of SOLVER Nano significantly increases due to the use of various options:

- Nano Vacuum Australia and New Zealand

Available SPM modes

HybriD^TMAFM technique

Contact AFM
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation Microscopy
Piezoresponse Force Microscopy

Amplitude modulation AFM,
Attractive & Repulsive regimes
Relief Imaging
Phase Imaging mode
Error mode

Electrostatic Force Mikroscopy
Scanning Capacitance Force Microscopy
Kelvin Probe Force Microscopy

Magnetic Force Microscopy

AFM Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

Lithographies
АAFM Oxidation Lithography
STM Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing

Specifications

General specs:

Scanner	100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
AFM resolution	0.01 nm
Environments	Air and liquid measurements.
Combined video optical microscopes	Build in 100x optical USB microscope External 500x optical microscope
Design	Table-top, affordable, robust and user-friendly

Scanner
Scanning field	High voltage regime: 100x100x12 um Low voltage regime: 3x3x3 um
Scanner type	Metrological piezotube XYZ scanner with sensors
Sensors type	XYZ – ultrafast capacitance sensors
Sensors noise	Low noise XY sensor: <0.3 nm Metrological Z sensor: <0.03 nm
Sensors linearity	Metrological XY sensor: <0.1% Metrological Z sensor: <0.1%
Overall scanner parameters	100x100x12 um with CL Resolution: XY - 0.3 nm, Z - 0.03 nm Linearity: XY - <0.1%, Z - <0.1% 3x3x3 um with OL. Resolution: XY - 0.05 nm, Z - 0.01 nm
Sample
Sample positioning range	12 mm
Sample positioning resolution	1.5 um
Sample dimension	up to 1,5” X 1,5” X 1/2”, 35x35x12 mm
Sample weight	up to 100 g
Approach system type	Z – Stepper Motor
Approach system step size	230 nm
Approach system speed rate	10 mm per min
Algorithm Gentle approach	Available (probe guaranteed to stop before it touches the sample)
Scanning Heads
AFM head for Si cantilever	Available. All commercial cantilevers can be used
Type of cantilever detection	Laser/Detector Alignment
Probe holders	Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting	Cinematically mount. Mount accuracy 150 nm (Remove/mount accuracy)
STM AFM head for wire probes	Available. Tungsten wire for AFM measurement. (low cost experiments) Pt\|Ir wire for STM measurements
Type of cantilever detection	Piezo for AFM measurement
Probe holders	Probe holder for air and liquid measurements
Controllers. Digital professional controller
Number of images can be acquired during one scanning cycle	Up to 16
Image size	Up to 8Kx8K scan size
ADC	500 kHz 16-bit ADC 12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000) Individual filter on each channel
DSP	Floating point 320 MHz DSP
Digital FB	Yes 6 Channels
DACs:	4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage 2 16-bit DAC for user output
XYZ scanner control voltage	High-voltage outputs: X, -X, Y, -Y, Z, -Z at -150 V to +150 V Low-voltage mode XY ± 10 V
XY RMS noise in 1000 Hz bandwidth	0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth	0.3 ppm RMS
XY bandwidth	4 kHz (LV regime – 10 kHz)
Z bandwidth	9 kHz
Maximal current of XY amplifiers	1.5 mA
Maximal current of Z amplifiers	8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors	Yes
Open/Closed-loop mode for X,Y controlх	Yes
Generator frequency setting range	DC – 5 MHz
Deflection registration channel bandwidth	170 Hz - 5 MHz
Lateral Force registration channel bandwidth	170 Hz - 5 MHz
2 additional registration channel bandwidth	170 Hz - 5 MHz
Bias Voltage	± 10 V bandwidth 0 – 5 MHz
Modulating signals supply	To the probe (external output); High-voltage X,Y, Z channels (including LV regime); Bias Voltage
Number of generators for modulation, user accessible	2, 0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs	Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs	6
Additional digital outputs	1
I2C bus	Yes
	Macro language
Max. cable length between the controller and SPM base or measuring heads	2 m
Computer interface	USB 2.0
Voltage supply	110/220 V
Power consumption	≤ 110 W

Related Products
Viewed Products