AFM-Raman / IR / TERS - NTEGRA NANO IR

Brand: NT-MDT

Product Code: NTEGRA NANO IR

Availability: On Request

Ultralow drift advanced AFM-IR & s‑SNOM imaging and spectroscopy

Main features:

  • IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution
  • Wide spectral range of operation: 3-12 μm
  • Incredibly low thermal drift and high signal stability
  • Versatile AFM with advanced modes: SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces)
  • HybriD Mode™ - quantitative nanomechanical mapping
  • Integration with microRaman (optional)
  • The ability of s‑SNOM measurements in the visible spectral range (optional)

NT-MDT Spectrum Instruments presents NTEGRA Nano IR - scattering scanning near-field optical microscope (s‑SNOM) designed for infrared (IR) spectral range.

AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies. NTEGRA Nano IR system allows detection of near-field signal amplitude and phase. Spatial resolution of IR s‑SNOM is about 10 nm and defined only by tip size.



Applications

  • Ultrathin films: Oligothiophene monolayers on Silicon
  • Phase transition behavior of VO2 film
  • Si-SiO2 calibration grating
  • PS/PVAC film on the conducting ITO substrate
  • Thermoplastic vulcanizate (TPV)
  • Si microstructure with p-doping areas

 NTEGRAIR Application - Nano Vacuum Australia and New Zealand

Topography (left), reflection for λ=10.6 μm (center) and cross section of reflection signal (right). Sample courtesy to Dr. A. Mourran (DWI, Aachen, Germany). Measured by Dr. G. Andreev (EVS Co)

Specifications

Lasers and light input system

  • Free space coupling module for easy laser source switching without realignment
  • CO2 laser: TEC cooled, stabilized, software tunable CO2 laser, λ=10.3-10.8 μm with improved laser stability: less than +/-0.25 % variation in 30 min
  • Tunable midIR lasers in the range 4-11 μm with Mode-Hop-Free tuning range 60 cm-1 typically
  • Displacement free attenuators. Transmission level of 0.05, 0.12, 0.2, 0.25, 0.45

s‑SNOM imaging and spectroscopy system

  • High NA parabolic mirror or standard objective with aperture 0.35 NA. Broadband (3‑12 μm) IR beamsplitter optimized for s‑SNOM
  • Piezo-actuated reference mirror with closed-loop controller. Closed-loop interferometer reference arm control (tip/tilt). Enables remote optimization of the interferometer
  • XYZ micrometer linear translation stage and piezo-stage for hot-spot alignment
  • Low noise LN2 cooled MCT detector: <30 nV/√Hz at tapping frequency harmonics (100 kHz – 1 MHz)
  • Modular design: all essential components are replaceable. Includes free space module, detector, beam splitter, focusing, collimating and detector lenses
  • Controlled gas environment and temperature for highest stability and possibility to operate at IR atmospheric absorption bands
  • Visible laser for IR beam tracking and control of optical system alignment

AFM

  • High-performance low noise AFM: Z-noise <0.05 nm (RMS in 10-1000 Hz bandwidth)
  • 10 nm AFM and s‑SNOM spatial resolution
  • Low system drift – titanium head design minimize phase drift between tip and interferometer reference mirror
  • Stable AFM performance at high temperatures: up to 150 °C with standard heating stage
  • XYZ closed-loop sample scanner 100x100x10 μm
  • Sample approach system. Different sample height does not require optical realignments after sample change
  • Focus track feature: sample always stays in focus due to sample Z-feedback
  • All standard SPM imaging modes are supported (>30 modes including KPFM, SRI, PFM, SCM) — combined with IR s‑SNOM Integration with HybriD Mode™ for nanoscale stiffness and adhesion properties investigation Top viewing microscope with 1 μm spatial resolution